N type MBB cell with new circuit design for lower internal resistance loss.
Bifacial Cell Higher Power Output Lower BOS & LCOE.
2 times of industry standard Anti-PID test by TUV SUD.
Higher performance under low light environment conditions.
Ensure the attenuation probability caused by PID phenomenon minimized.
Contact: Mr.Calway Chow
Phone: 0086-18262684986
E-mail: info@flagsun.com
Whatsapp:0086-13814572602
Add: No.119 Yanshan west Road,Chengxiang Town,Taicang City,Jiangsu ,China
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